Analysis and modification of defective surface aggregates on PCDTBT:PCBM solar cell blends using combined Kelvin probe, conductive and bimodal atomic force microscopy

• Hanaul Noh,
• Alfredo J. Diaz and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2017, 8, 579–589, doi:10.3762/bjnano.8.62

• aggregates and modification of their structures on PCDTBT-based polymer solar cells using combined Kelvin probe (KPFM), conductive (C-AFM) and bimodal atomic force microscopy (AFM). Topography changes for partly removed aggregates show that the aggregates are composed of molecular thin layers of about 0.8 nm

Generalized Hertz model for bimodal nanomechanical mapping

• Aleksander Labuda,
• Marta Kocuń,
• Waiman Meinhold,
• Deron Walters and
• Roger Proksch

Beilstein J. Nanotechnol. 2016, 7, 970–982, doi:10.3762/bjnano.7.89

• Aleksander Labuda Marta Kocun Waiman Meinhold Deron Walters Roger Proksch Asylum Research, an Oxford Instruments company, Santa Barbara, CA, 93117, USA 10.3762/bjnano.7.89 Abstract Bimodal atomic force microscopy uses a cantilever that is simultaneously driven at two of its eigenmodes (resonant

• experimental data and extract a shape and size of the tip interacting with a polystyrene surface. Keywords: bimodal atomic force microscopy; bimodal spectroscopy; contact mechanics; multifrequency; nanomechanical mapping; nanomechanics; Introduction Over the decades since its invention [1] the atomic force

High-bandwidth multimode self-sensing in bimodal atomic force microscopy

• Michael G. Ruppert and
• S. O. Reza Moheimani

Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

• contrast reversal discussed in section Approach curves is clearly visible. Conclusion Experimental results using monomodal and bimodal atomic force microscopy with the first and fifth eigenmode of a piezoelectric cantilever on a variety of samples validate that the self-sensing scheme proposed in this work

Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model

• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 1649–1663, doi:10.3762/bjnano.5.176

• single-mode and bimodal atomic force microscopy (AFM) with particular focus on the viscoelastic interactions occurring during tip–sample impact. The surface is modeled by using a standard linear solid model, which is the simplest system that can reproduce creep compliance and stress relaxation, which are

Trade-offs in sensitivity and sampling depth in bimodal atomic force microscopy and comparison to the trimodal case

• Babak Eslami,
• Daniel Ebeling and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 1144–1151, doi:10.3762/bjnano.5.125

• experiments on Nafion® proton exchange membranes and numerical simulations illustrating the trade-offs between the optimization of compositional contrast and the modulation of tip indentation depth in bimodal atomic force microscopy (AFM). We focus on the original bimodal AFM method, which uses amplitude

Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case

• Daniel Ebeling and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 198–207, doi:10.3762/bjnano.4.20

Repulsive bimodal atomic force microscopy on polymers

• Alexander M. Gigler,
• Christian Dietz,
• Maximilian Baumann,
• Nicolás F. Martinez,
• Ricardo García and
• Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

• and Department of Materials Sciences, Technische Universität Darmstadt, Petersenstr. 32, 64287 Darmstadt, Germany Instituto de Microelectrónica de Madrid, c/ Isaac Newton 8, Tres Cantos, 28760 Madrid, Spain 10.3762/bjnano.3.52 Abstract Bimodal atomic force microscopy can provide high-resolution

Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus

• Elena T. Herruzo and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2012, 3, 198–206, doi:10.3762/bjnano.3.22

• Elena T. Herruzo Ricardo Garcia IMM-Instituto de Microelectrónica de Madrid (CSIC). C Isaac Newton 8, 28760 Madrid, Spain 10.3762/bjnano.3.22 Abstract Bimodal atomic force microscopy is a force-microscopy method that requires the simultaneous excitation of two eigenmodes of the cantilever. This